{
  "@context": {
    "@vocab": "http://ddialliance.org/Specification/DDI-CDI/1.0/RDF/",
    "schema": "http://schema.org/",
    "dcterms": "http://purl.org/dc/terms/",
    "geosparql": "http://www.opengis.net/ont/geosparql#",
    "spdx": "http://spdx.org/rdf/terms#",
    "cdi": "http://ddialliance.org/Specification/DDI-CDI/1.0/RDF/",
    "time": "http://www.w3.org/2006/time#",
    "skos": "http://www.w3.org/2004/02/skos/core#",
    "csvw": "http://www.w3.org/ns/csvw#",
    "xas": "https://xas.org/dictionary/",
    "nxs": "http://purl.org/nexusformat/definitions/",
    "prov": "http://www.w3.org/ns/prov#",
    "dcat": "http://www.w3.org/ns/dcat#",
    "cdif": "https://cdif.org/profiles/",
    "ex": "https://example.org/",
    "igsn": "https://igsn.org/"
  },
  "@id": "xas:487y54123",
  "@type": [
    "schema:Dataset",
    "schema:Product"
  ],
  "schema:name": "X-ray absorption spectra for K edge, Iron metal, XDI CDIF example",
  "schema:description": "Example metadata including all properties in the CDIF XAS profile",
  "schema:identifier": "https://doi.org/10.9999/aqweropjh",
  "schema:dateModified": "2025-06-22",
  "schema:datePublished": "2025-06-22",
  "schema:creator": {
    "@list": [
      {
        "@id": "https://orcid.org/3547ulkj",
        "@type": [
          "schema:Person"
        ],
        "schema:name": "Collectus, Poindexter",
        "schema:contactPoint": {
          "@type": [
            "schema:ContactPoint"
          ],
          "schema:email": "missing@email.org"
        }
      }
    ]
  },
  "schema:contributor": [
    {
      "@type": [
        "schema:Role"
      ],
      "schema:roleName": "Facility",
      "schema:contributor": {
        "@type": [
          "schema:Organization"
        ],
        "@id": "https://ror.org/aps",
        "schema:name": "Argonne Synchotron"
      }
    },
    {
      "@type": [
        "schema:Role"
      ],
      "schema:roleName": "dataCollector",
      "schema:contributor": {
        "@id": "https://orcid.org/3547ulkj"
      }
    },
    {
      "@type": [
        "schema:Role"
      ],
      "schema:roleName": "principleInvestigator",
      "schema:contributor": {
        "@type": [
          "schema:Person"
        ],
        "@id": "https://orcid.org/35735ul",
        "schema:name": "Scienceguy, Biggus",
        "schema:contactPoint": {
          "@type": [
            "schema:ContactPoint"
          ],
          "schema:email": "missing@email.org"
        },
        "schema:affiliation": {
          "@type": [
            "schema:Organization"
          ],
          "@id": "https://ror.org/lejkthoj",
          "schema:name": "Big Science Institute"
        }
      }
    }
  ],
  "schema:license": [
    "https://creativecommons.org/publicdomain/zero/1.0/"
  ],
  "schema:distribution": [
    {
      "@type": [
        "schema:DataDownload",
        "cdi:TabularTextDataSet"
      ],
      "schema:name": "XDI data file for Se K-edge XAS",
      "schema:contentUrl": "https://github.com/XraySpectroscopy/XASDataLibrary/blob/master/data/Se/Se_Na2SeO4_rt_01.xdi",
      "schema:description": "Fixed-width text file conformant with XDI specification. Contains three data columns: monochromator energy (eV), transmitted intensity (counts), and incident intensity (counts). 27-line header with comment prefix '#'.",
      "schema:encodingFormat": [
        "text/plain"
      ],
      "cdi:isFixedWidth": true,
      "dcterms:conformsTo": [
        {
          "@id": "https://github.com/XraySpectroscopy/XAS-Data-Interchange/blob/master/specification/spec.md"
        }
      ],
      "cdif:hasPhysicalMapping": [
        {
          "cdif:index": 0,
          "cdif:format": "decimal",
          "cdif:physicalDataType": "float64",
          "cdi:isRequired": true,
          "cdif:formats_InstanceVariable": {
            "@id": "xas:monochromatorEnergy"
          }
        },
        {
          "cdif:index": 1,
          "cdif:format": "decimal",
          "cdif:physicalDataType": "float64",
          "cdi:isRequired": true,
          "cdif:formats_InstanceVariable": {
            "@id": "xas:transmittedIntensity"
          }
        },
        {
          "cdif:index": 2,
          "cdif:format": "decimal",
          "cdif:physicalDataType": "float64",
          "cdi:isRequired": true,
          "cdif:formats_InstanceVariable": {
            "@id": "xas:incidentIntensity"
          }
        }
      ]
    }
  ],
  "schema:measurementTechnique": [
    {
      "@type": [
        "schema:DefinedTerm"
      ],
      "schema:name": "X-Ray Absorption Spectroscopy",
      "schema:identifier": "http://purl.org/pan-science/PaNET/PaNET01196",
      "schema:termCode": "XAS",
      "schema:inDefinedTermSet": "http://purl.org/pan-science/PaNET/PaNET.owl"
    },
    {
      "@type": [
        "schema:DefinedTerm"
      ],
      "schema:name": "Transmission",
      "schema:identifier": "xas:transmissionMode",
      "schema:inDefinedTermSet": "nxs:Field/NXxas/ENTRY/DATA/mode"
    }
  ],
  "schema:keywords": [
    {
      "@type": [
        "schema:DefinedTerm"
      ],
      "schema:name": "K-edge",
      "schema:identifier": "missing",
      "schema:termCode": "K",
      "schema:inDefinedTermSet": "https://github.com/XraySpectroscopy/XAS-Data-Interchange/blob/master/specification/dictionary.md"
    },
    {
      "@type": [
        "schema:DefinedTerm"
      ],
      "schema:name": "Selenium",
      "schema:identifier": "http://sweetontology.net/matrElement/Selenium",
      "schema:termCode": "Se",
      "schema:inDefinedTermSet": "http://sweetontology.net/matrElement"
    }
  ],
  "prov:wasGeneratedBy": [
    {
      "@type": [
        "schema:Action",
        "xas:AnalysisEvent",
        "prov:Activity"
      ],
      "schema:identifier": "20241111_DSC_NU_OREX-803224-0_1",
      "schema:startDate": "2008-04-10T21:58:50",
      "prov:used": [
        {
          "schema:instrument": {
            "@type": [
              "schema:Thing",
              "schema:Product"
            ],
            "schema:additionalType": [
              "wd:Q3099911"
            ],
            "schema:name": "XAS analytical instrument system",
            "schema:category": "X-ray Absorption Spectroscopy",
            "schema:hasPart": [
              {
                "@type": [
                  "schema:Thing",
                  "schema:Product"
                ],
                "schema:additionalType": "nxs:BaseClass/NXsource",
                "schema:name": "source, made up for this example",
                "schema:identifier": "should have a registry with URIs",
                "schema:additionalProperty": [
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXsource/type"
                    ],
                    "schema:name": "x-ray source",
                    "schema:value": "Synchrotron X-ray Source"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXsource/probe"
                    ],
                    "schema:name": "Probe",
                    "schema:value": "x-ray"
                  }
                ]
              },
              {
                "@type": [
                  "schema:Thing",
                  "schema:Product"
                ],
                "schema:additionalType": "xas:Beamline",
                "schema:name": "13-BM-D",
                "schema:identifier": "should have a registry with URIs",
                "schema:additionalProperty": [
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "xas:collimation"
                    ],
                    "schema:name": "collimation technique",
                    "schema:value": "none"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "xas:focusing"
                    ],
                    "schema:name": "focusing",
                    "schema:value": "???"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "xas:harmonic_rejection"
                    ],
                    "schema:name": "harmonic_rejection",
                    "schema:value": "Rh-coated mirror, detuned"
                  }
                ]
              },
              {
                "@type": [
                  "schema:Thing",
                  "schema:Product"
                ],
                "schema:additionalType": "nxs:BaseClass/NXmonochromator",
                "schema:name": "Si 111",
                "schema:additionalProperty": [
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXcrystal/d_spacing"
                    ],
                    "schema:name": "d-spacing",
                    "schema:value": "3.13550",
                    "schema:unitText": "Angstrom"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXcrystal/chemical_formula"
                    ],
                    "schema:name": "chemical formula",
                    "schema:value": "Si"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXcrystal/type"
                    ],
                    "schema:name": "crystal type",
                    "schema:value": "missing"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXcrystal/reflection"
                    ],
                    "schema:name": "reflection plane (hkl)",
                    "schema:value": "1,1,1"
                  }
                ]
              },
              {
                "@type": [
                  "schema:Thing",
                  "schema:Product"
                ],
                "schema:additionalType": "nxs:BaseClass/NXmonitor",
                "schema:additionalProperty": [
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXmonitor/mode"
                    ],
                    "schema:name": "monitor mode",
                    "schema:value": "monitor"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXmonitor/preset"
                    ],
                    "schema:name": "monitor preset",
                    "schema:value": "N.A."
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "xas:detector.i0"
                    ],
                    "schema:name": "detector mode i0",
                    "schema:alternateName": [
                      "incident flux measurement method"
                    ],
                    "schema:value": "10cm  N2"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "xas:detector.it"
                    ],
                    "schema:name": "detector mode it",
                    "schema:alternateName": [
                      "transmitted flux measurement method"
                    ],
                    "schema:value": "10cm  N2"
                  }
                ]
              }
            ]
          }
        }
      ],
      "schema:additionalProperty": [
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "xas:pressure"
          ],
          "schema:name": "experiment environment-pressure",
          "schema:description": "extrinsic properties of measurement environment--temperature, pressure, e-field, mag-field.  have to check magnetic_moment, electrochemical_potential",
          "schema:value": 3567,
          "schema:unitText": "KPa"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "xas:edge_energy"
          ],
          "schema:name": "Absorption edge",
          "schema:value": "12658.0",
          "schema:unitText": "eV"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Group/NXdetector/calibration_method"
          ],
          "schema:name": "calibration method",
          "schema:value": "description of calibration procedure",
          "schema:url": "http://protocols.io/link/to/calibrationMethod"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Group/NXentry/experiment_documentation"
          ],
          "schema:name": "Instrument configuration",
          "schema:value": "description of instrument configuration",
          "schema:url": "http://protocols.io/link/to/calibrationMethod"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "xas:installedOptions"
          ],
          "schema:name": "Installed Options",
          "schema:value": "Description of extra equipment installed on the base instrument(?)"
        }
      ],
      "schema:location": {
        "@id": "ex:xasfacility_37yht",
        "@type": [
          "schema:Place"
        ],
        "schema:additionalType": [
          "xas:Facility"
        ],
        "schema:identifier": "https://ror.org/aps",
        "schema:name": "APS",
        "schema:additionalProperty": [
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:energy"
            ],
            "schema:name": "Facility energy",
            "schema:value": "7.00",
            "schema:unitText": "GeV"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:current"
            ],
            "schema:name": "Facility current",
            "schema:value": "120",
            "schema:unitText": "Amps"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:xray_source"
            ],
            "schema:name": "X-ray Source",
            "schema:value": "APS bending magnet"
          }
        ]
      },
      "schema:mainEntity": {
        "@type": [
          "schema:Thing",
          "schema:Product"
        ],
        "schema:additionalType": [
          "MaterialSample",
          "https://w3id.org/isample/vocabulary/materialsampleobjecttype/materialsample"
        ],
        "schema:name": "Na2SeO4",
        "schema:identifier": "igsn:10.6620/357lkj",
        "schema:description": "physical properties of sample: ph, eh, volume, porosity, density, concentration, resistivity, viscosity, crystal structure, opacity from xdi list...",
        "schema:additionalProperty": [
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:porosity"
            ],
            "schema:name": "Porosity",
            "schema:value": 27,
            "schema:unitText": "percent"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:stoichiometry"
            ],
            "schema:name": "Stoichiometry",
            "schema:value": "Na2SeO4"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:samplePreparation"
            ],
            "schema:name": "samaple preparation method",
            "schema:value": "powder on tape, 6 layers"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "nxs:Field/NXsample/mass"
            ],
            "schema:name": "sample mass",
            "schema:value": "10",
            "schema:unitText": "mg"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "nxs:Field/NXsample/point_group"
            ],
            "schema:name": "crystallographic point group",
            "schema:value": "mm2"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "nxs:Field/NXsample/unit_cell"
            ],
            "schema:name": "Crystal unit cell dimensions",
            "schema:value": "cubic; Z = 4; a = 5.46; V = 162.77"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:parentSample"
            ],
            "schema:name": "parent sample identifier",
            "schema:value": "igsn:10.3476/342573"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:materialState"
            ],
            "schema:name": "material state",
            "schema:value": "solid metal foil"
          }
        ]
      }
    }
  ],
  "schema:variableMeasured": [
    {
      "@id": "xas:monochromatorEnergy",
      "@type": [
        "cdi:InstanceVariable",
        "schema:PropertyValue"
      ],
      "schema:name": "energy",
      "schema:alternateName": [
        "Monochromator energy"
      ],
      "schema:description": "missing, definition of what this variable is about (maybe even an iAdopt description",
      "schema:propertyID": [
        "xas:monochromatorEnergyConcept"
      ],
      "schema:unitText": "eV",
      "identifier": "should be URI from nexusFormat organization",
      "physicalDataType": "https://www.w3.org/TR/xmlschema-2/#decimal",
      "simpleUnitOfMeasure": "eV",
      "uses": "xas:monochromatorEnergyConcept",
      "name": "energy",
      "displayLabel": "monochromator energy"
    },
    {
      "@id": "xas:incidentIntensity",
      "@type": [
        "cdi:InstanceVariable",
        "schema:PropertyValue"
      ],
      "schema:name": "i0 monitory intensity",
      "schema:alternateName": [
        "Monitor intensity"
      ],
      "schema:description": "missing, definition of what this variable is about (maybe even an iAdopt description)",
      "schema:propertyID": [
        "xas:incidentIntensityConcept"
      ],
      "schema:unitText": "counts",
      "identifier": "should be URI from nexusFormat organization",
      "physicalDataType": "https://www.w3.org/TR/xmlschema-2/#decimal",
      "uses": "xas:incidentIntensityConcept",
      "name": "i0",
      "displayLabel": "monitor intensity"
    },
    {
      "@id": "xas:transmittedIntensity",
      "@type": [
        "cdi:InstanceVariable",
        "schema:PropertyValue"
      ],
      "schema:description": "missing, definition of what this variable is about (maybe even an iAdopt description",
      "schema:propertyID": [
        "xas:transmittedIntensityConcept"
      ],
      "schema:unitText": "counts",
      "schema:name": "itrans",
      "schema:alternateName": [
        "transmission intensity"
      ],
      "physicalDataType": "https://www.w3.org/TR/xmlschema-2/#decimal",
      "identifier": "should be URI from nexusFormat organization",
      "uses": "xas:transmittedIntensityConcept",
      "name": "itrans",
      "displayLabel": "transmission intensity"
    }
  ],
  "relatedLink": [
    {
      "@type": "LinkRole",
      "linkRelationship": "projectProposal",
      "target": {
        "@type": "EntryPoint",
        "encodingType": "text/html",
        "name": "name of the proposal",
        "url": "https://example.org/locatorForProposalText",
        "identifier": "identifier for proposal, could used text or schema:PropertyValue pattern"
      }
    }
  ],
  "schema:subjectOf": {
    "@id": "xas:ja51-pz63",
    "@type": [
      "schema:Dataset"
    ],
    "schema:additionalType": [
      "dcat:CatalogRecord"
    ],
    "schema:dateModified": "2025-08-26",
    "schema:creator": [
      {
        "@id": "https://ada.org/person/3479",
        "@type": [
          "schema:Person"
        ],
        "schema:name": "Richard, Stephen M.",
        "schema:identifier": "https://orcid.org/0000-0002-7933-2154",
        "schema:contactPoint": {
          "@type": [
            "schema:ContactPoint"
          ],
          "schema:email": "smrTucson@email.org"
        }
      }
    ],
    "schema:about": {
      "@id": "xas:485749"
    },
    "schema:description": "metadata about documentation for se_na2so4",
    "dcterms:conformsTo": [
      {
        "@id": "https://w3id.org/cdif/core/1.1"
      },
      {
        "@id": "https://w3id.org/cdif/discovery/1.1"
      },
      {
        "@id": "https://w3id.org/cdif/data_description/1.1"
      },
      {
        "@id": "https://w3id.org/cdif/xasDiscovery/1.0"
      },
      {
        "@id": "https://w3id.org/cdif/xasCore/1.0"
      }
    ]
  }
}