{
  "@context": {
    "schema": "http://schema.org/",
    "dcterms": "http://purl.org/dc/terms/",
    "dcat": "http://www.w3.org/ns/dcat#",
    "geosparql": "http://www.opengis.net/ont/geosparql#",
    "spdx": "http://spdx.org/rdf/terms#",
    "ex": "https://example.org/",
    "xsd": "http://www.w3.org/2001/XMLSchema#",
    "xas": "https://xas.org/dictionary/",
    "nxs": "http://purl.org/nexusformat/definitions/",
    "cdi": "http://ddialliance.org/Specification/DDI-CDI/1.0/RDF/",
    "prov": "http://www.w3.org/ns/prov#"
  },
  "@id": "ex:xas-dataset-001",
  "@type": [
    "schema:Dataset",
    "schema:Product"
  ],
  "schema:name": "Se K-edge XANES of Na2SeO4 reference compound",
  "schema:identifier": {
    "@type": [
      "schema:PropertyValue"
    ],
    "schema:propertyID": "https://doi.org",
    "schema:value": "10.12345/xas.2024.001",
    "schema:url": "http://example.com/resource?foo=bar#fragment"
  },
  "schema:dateModified": "2025-06-15",
  "schema:conditionsOfAccess": [
    "Public access, no restrictions"
  ],
  "schema:license": [
    "https://creativecommons.org/licenses/by/4.0/"
  ],
  "schema:url": "http://example.com/resource?foo=bar#fragment",
  "schema:distribution": [
    {
      "@id": "lMtIx",
      "@type": [
        "schema:DataDownload",
        "cdi:PhysicalDataset"
      ],
      "schema:name": "XDI data file",
      "schema:contentUrl": "http://example.com/resource/35uj46j",
      "schema:encodingFormat": [
        "application/x-xdi"
      ],
      "dcterms:conformsTo": [
        {
          "@id": "https://github.com/XraySpectroscopy/XAS-Data-Interchange/blob/master/specification/spec.md"
        }
      ],
      "spdx:checksum": {
        "@type": [
          "spdx:Checksum"
        ],
        "spdx:algorithm": "SHA-256",
        "spdx:checksumValue": "a1b2c3d4e5f6..."
      },
      "schema:provider": [
        {
          "@id": "plTqxpHjBTESztfaDyI"
        }
      ]
    },
    {
      "@id": "RNdlTIf",
      "@type": [
        "schema:DataDownload"
      ],
      "schema:name": "Processed spectrum CSV",
      "schema:contentUrl": "http://example.com/resource/34h5ykl",
      "schema:encodingFormat": [
        "text/csv",
        "application/zip"
      ],
      "spdx:checksum": {
        "@type": [
          "spdx:Checksum"
        ],
        "spdx:algorithm": "MD5",
        "spdx:checksumValue": "d41d8cd98f00b204e9800998ecf8427e"
      },
      "schema:provider": [
        {
          "@id": "EwHwOWWPjkVxr"
        }
      ],
      "dcterms:conformsTo": [
        {
          "@id": "http://www.opengis.net/def/nil/OGC/0/missing"
        }
      ]
    }
  ],
  "schema:subjectOf": {
    "@type": [
      "schema:Dataset"
    ],
    "schema:additionalType": [
      "dcat:CatalogRecord"
    ],
    "@id": "urn:uuid:xas-required-catalog-record",
    "schema:about": {
      "@id": "ex:xas-dataset-001"
    },
    "dcterms:conformsTo": [
      {
        "@id": "https://w3id.org/cdif/core/1.1"
      },
      {
        "@id": "https://w3id.org/cdif/discovery/1.1"
      },
      {
        "@id": "https://w3id.org/cdif/xasCore/1.0"
      },
      {
        "@id": "https://w3id.org/cdif/bbr/metadata/xasProperties/xasCore"
      }
    ],
    "schema:maintainer": {
      "@id": "nKwywfsuBh",
      "@type": [
        "schema:Person"
      ],
      "schema:name": "Cataloger, Example Data",
      "schema:contactPoint": {
        "@type": [
          "schema:ContactPoint"
        ],
        "schema:email": "cataloger@example.org"
      }
    },
    "schema:sdDatePublished": "2025-08-15T06:45:40Z",
    "schema:includedInDataCatalog": {
      "@id": "nbUunSyw",
      "@type": [
        "schema:DataCatalog"
      ],
      "schema:name": "XAS Data Library",
      "schema:url": "http://example.com/resource?foo=bar#fragment"
    }
  },
  "prov:wasGeneratedBy": [
    {
      "prov:used": [
        {
          "schema:instrument": {
            "@type": [
              "schema:Thing",
              "schema:Product"
            ],
            "schema:name": "APS Sector 20-BM beamline instrument",
            "schema:category": [
              {
                "@type": [
                  "schema:DefinedTerm"
                ],
                "schema:name": "X-ray absorption spectroscopy beamline",
                "schema:termCode": "XAS-beamline"
              }
            ],
            "schema:hasPart": [
              {
                "@type": [
                  "schema:Thing",
                  "schema:Product"
                ],
                "schema:additionalType": "nxs:BaseClass/NXsource",
                "schema:name": "APS bending magnet source",
                "schema:additionalProperty": [
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXsource/type"
                    ],
                    "schema:name": "x-ray source",
                    "schema:value": "Synchrotron X-ray Source"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXsource/probe"
                    ],
                    "schema:name": "Probe",
                    "schema:value": "x-ray"
                  }
                ]
              },
              {
                "@type": [
                  "schema:Thing",
                  "schema:Product"
                ],
                "schema:additionalType": "nxs:BaseClass/NXmonochromator",
                "schema:name": "Si 111",
                "schema:additionalProperty": [
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXcrystal/d_spacing"
                    ],
                    "schema:name": "d-spacing",
                    "schema:value": "3.13550",
                    "schema:unitText": "Angstrom"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXcrystal/type"
                    ],
                    "schema:name": "crystal type",
                    "schema:value": "Si(111)"
                  },
                  {
                    "@type": [
                      "schema:PropertyValue"
                    ],
                    "schema:propertyID": [
                      "nxs:Field/NXcrystal/reflection"
                    ],
                    "schema:name": "reflection plane (hkl)",
                    "schema:value": "1,1,1"
                  }
                ]
              }
            ]
          }
        }
      ],
      "schema:object": {
        "@type": [
          "schema:Product",
          "schema:Thing"
        ],
        "schema:additionalType": [
          "MaterialSample",
          "https://w3id.org/isample/vocabulary/materialsampleobjecttype/materialsample"
        ],
        "schema:name": "Na2SeO4",
        "schema:identifier": "igsn:10.6620/se-selenate-001",
        "schema:description": "Sodium selenate reference compound, powder",
        "schema:additionalProperty": [
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "https://example.org/vocab/sample-prep"
            ],
            "schema:name": "sample preparation method",
            "schema:value": "powder on tape, 6 layers"
          },
          {
            "@type": [
              "schema:PropertyValue"
            ],
            "schema:propertyID": [
              "xas:stoichiometry"
            ],
            "schema:name": "Stoichiometry",
            "schema:value": "Na2SeO4"
          }
        ]
      }
    }
  ],
  "schema:measurementTechnique": [
    {
      "@type": [
        "schema:DefinedTerm"
      ],
      "schema:name": "X-Ray Absorption Spectroscopy",
      "schema:termCode": "XAS",
      "schema:identifier": "http://purl.org/pan-science/PaNET/PaNET01196",
      "schema:inDefinedTermSet": "http://purl.org/pan-science/PaNET/PaNET.owl"
    },
    {
      "@type": [
        "schema:DefinedTerm"
      ],
      "schema:name": "Transmission",
      "schema:identifier": "http://purl.org/pan-science/PaNET/PaNET01188",
      "schema:inDefinedTermSet": "nxs:Field/NXxas/ENTRY/DATA/mode"
    }
  ],
  "schema:keywords": [
    {
      "@type": [
        "schema:DefinedTerm"
      ],
      "schema:name": "K-edge",
      "schema:identifier": "https://github.com/XraySpectroscopy/XAS-Data-Interchange/blob/master/specification/dictionary.md#K",
      "schema:termCode": "K",
      "schema:inDefinedTermSet": "https://github.com/XraySpectroscopy/XAS-Data-Interchange/blob/master/specification/dictionary.md"
    },
    {
      "@type": [
        "schema:DefinedTerm"
      ],
      "schema:name": "Selenium",
      "schema:identifier": "http://sweetontology.net/matrElement/Selenium",
      "schema:termCode": "Se",
      "schema:inDefinedTermSet": "http://sweetontology.net/matrElement"
    }
  ]
}