{
  "@context": {
    "schema": "http://schema.org/",
    "prov": "http://www.w3.org/ns/prov#",
    "ex": "https://example.org/",
    "xas": "https://xas.org/dictionary/",
    "nxs": "http://purl.org/nexusformat/definitions/",
    "wd": "https://www.wikidata.org/entity/",
    "xsd": "http://www.w3.org/2001/XMLSchema#"
  },
  "@id": "ex:exampleGeneratedBy_w46j6j",
  "@type": [
    "schema:Action",
    "xas:AnalysisEvent",
    "prov:Activity"
  ],
  "schema:identifier": "20241111_DSC_NU_OREX-803224-0_1",
  "schema:startDate": "2008-04-10T21:58:50",
  "prov:used": [
    {
      "schema:instrument": {
        "@type": [
          "schema:Thing",
          "schema:Product"
        ],
        "schema:additionalType": [
          "wd:Q3099911"
        ],
        "schema:name": "x-ray absorption analysis system",
        "schema:category": [
          {
            "@type": [
              "schema:DefinedTerm"
            ],
            "schema:name": "X-ray absorption spectroscopy instrument",
            "schema:termCode": "XAS",
            "schema:inDefinedTermSet": "https://vocab.nerc.ac.uk/collection/L05/current/"
          }
        ],
        "schema:hasPart": [
          {
            "@type": [
              "schema:Thing",
              "schema:Product"
            ],
            "schema:additionalType": [
              "nxs:BaseClass/NXsource",
              "wd:Q3099911"
            ],
            "schema:name": "APS bending magnet source",
            "schema:identifier": "https://www.aps.anl.gov/Beamlines/Directory/source/13-BM",
            "schema:additionalProperty": [
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "nxs:Field/NXsource/type"
                ],
                "schema:name": "X-ray source",
                "schema:value": "Synchrotron X-ray Source"
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "nxs:Field/NXsource/probe"
                ],
                "schema:name": "Probe",
                "schema:value": "x-ray"
              }
            ]
          },
          {
            "@type": [
              "schema:Thing",
              "schema:Product"
            ],
            "schema:additionalType": [
              "wd:Q3099911",
              "xas:Beamline"
            ],
            "schema:name": "13-BM-D",
            "schema:identifier": "https://www.aps.anl.gov/Beamlines/Directory/13-BM-D",
            "schema:additionalProperty": [
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "xas:collimation"
                ],
                "schema:name": "beamline collimation",
                "schema:value": "none"
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "xas:focusing"
                ],
                "schema:name": "focusing",
                "schema:value": "unknown"
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "xas:harmonic_rejection"
                ],
                "schema:name": "harmonic_rejection",
                "schema:value": "Rh-coated mirror, detuned"
              }
            ]
          },
          {
            "@type": [
              "schema:Thing",
              "schema:Product"
            ],
            "schema:additionalType": [
              "wd:Q3099911",
              "nxs:BaseClass/NXmonochromator"
            ],
            "schema:name": "Si 111",
            "schema:additionalProperty": [
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "nxs:Field/NXcrystal/d_spacing"
                ],
                "schema:name": "Monochromator d-spacing",
                "schema:value": "3.13550",
                "schema:unitText": "Angstrom"
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "nxs:Field/NXcrystal/chemical_formula"
                ],
                "schema:name": "Monochromator chemical formula",
                "schema:value": "Si"
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "nxs:Field/NXcrystal/type"
                ],
                "schema:name": "Monochromator crystal type",
                "schema:value": "crystal type"
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "nxs:Field/NXcrystal/reflection"
                ],
                "schema:name": "Reflecting plane",
                "schema:value": "1,1,1"
              }
            ]
          },
          {
            "@type": [
              "schema:Thing",
              "schema:Product"
            ],
            "schema:additionalType": [
              "wd:Q3099911",
              "nxs:BaseClass/NXmonitor"
            ],
            "schema:name": "x-ray intensity monitor",
            "schema:additionalProperty": [
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "nxs:Field/NXmonitor/mode"
                ],
                "schema:name": "monitor mode",
                "schema:value": "monitor"
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "nxs:Field/NXmonitor/preset"
                ],
                "schema:name": "monitor preset",
                "schema:value": "N.A."
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "xas:detector.i0"
                ],
                "schema:name": "detector mode i0",
                "schema:alternateName": "incident flux measurement method",
                "schema:value": "10cm  N2"
              },
              {
                "@type": [
                  "schema:PropertyValue"
                ],
                "schema:propertyID": [
                  "xas:detector.it"
                ],
                "schema:name": "detector mode it",
                "schema:alternateName": "transmitted flux measurement method",
                "schema:value": "10cm  N2"
              }
            ]
          }
        ]
      }
    }
  ],
  "schema:additionalProperty": [
    {
      "@type": [
        "schema:PropertyValue"
      ],
      "schema:propertyID": [
        "xas:pressure"
      ],
      "schema:description": "extrinsic properties of measurement environment--temperature, pressure, e-field, mag-field.  have to check magnetic_moment, electrochemical_potential",
      "schema:value": "3567",
      "schema:name": "Environment Pressure",
      "schema:unitText": "KPa"
    },
    {
      "@type": [
        "schema:PropertyValue"
      ],
      "schema:propertyID": [
        "xas:edge_energy"
      ],
      "schema:value": "12658.0",
      "schema:name": "Edge energy",
      "schema:unitText": "eV"
    },
    {
      "@type": [
        "schema:PropertyValue"
      ],
      "schema:propertyID": [
        "nxs:Group/NXdetector/calibration_method"
      ],
      "schema:name": "calibration method",
      "schema:value": "description of calibration procedure",
      "schema:url": "http://protocols.io/link/to/calibrationMethod"
    },
    {
      "@type": [
        "schema:PropertyValue"
      ],
      "schema:propertyID": [
        "nxs:Group/NXentry/experiment_documentation"
      ],
      "schema:name": "Instrument configuration",
      "schema:value": "description of instrument configuration",
      "schema:url": "http://protocols.io/link/to/calibrationMethod"
    },
    {
      "@type": [
        "schema:PropertyValue"
      ],
      "schema:propertyID": [
        "xas:installedOptions"
      ],
      "schema:name": "Installed Options",
      "schema:value": "Description of extra equipment installed on the base instrument(?)"
    }
  ],
  "schema:location": {
    "@id": "ex:xasfacility_37yht",
    "@type": [
      "schema:Place"
    ],
    "schema:additionalType": [
      "xas:Facility"
    ],
    "schema:identifier": "https://ror.org/aps",
    "schema:name": "APS",
    "schema:additionalProperty": [
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "xas:energy"
        ],
        "schema:name": "Facility energy",
        "schema:value": "7.00",
        "schema:unitText": "GeV"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "xas:current"
        ],
        "schema:name": "Facility current",
        "schema:value": "120",
        "schema:unitText": "Amps"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "xas:xray_source"
        ],
        "schema:name": "X-ray Source",
        "schema:value": "APS bending magnet"
      }
    ]
  },
  "schema:object": {
    "@type": [
      "schema:Thing",
      "schema:Product"
    ],
    "schema:additionalType": [
      "MaterialSample",
      "https://w3id.org/isample/vocabulary/materialsampleobjecttype/materialsample"
    ],
    "schema:name": "Na2SeO4",
    "schema:identifier": "igsn:10.6620/357lkj",
    "schema:description": "physical properties of sample: ph, eh, volume, porosity, density, concentration, resistivity, viscosity, crystal structure, opacity from xdi list...",
    "schema:additionalProperty": [
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "xas:porosity"
        ],
        "schema:name": "Porosity",
        "schema:value": "27",
        "schema:unitText": "percent"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "xas:stoichiometry"
        ],
        "schema:name": "Stoichiometry",
        "schema:value": "Na2SeO4"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "xas:samplePreparation"
        ],
        "schema:name": "Sample preparation",
        "schema:value": "powder on tape, 6 layers"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "nxs:Field/NXsample/mass"
        ],
        "schema:name": "Sample mass",
        "schema:value": "10",
        "schema:unitText": "mg"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "nxs:Field/NXsample/point_group"
        ],
        "schema:name": "Point group",
        "schema:value": "mm2"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "nxs:Field/NXsample/unit_cell"
        ],
        "schema:name": "Unit cell",
        "schema:value": "cubic; Z = 4; a = 5.46; V = 162.77"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "xas:parentSample"
        ],
        "schema:name": "Parent sample",
        "schema:value": "igsn:10.3476/342573"
      },
      {
        "@type": [
          "schema:PropertyValue"
        ],
        "schema:propertyID": [
          "xas:materialState"
        ],
        "schema:name": "Material state",
        "schema:value": "solid metal foil"
      }
    ]
  }
}