{
  "@context": {
    "schema": "http://schema.org/",
    "dcterms": "http://purl.org/dc/terms/",
    "skos": "http://www.w3.org/2004/02/skos/core#",
    "xas": "https://xas.org/dictionary/",
    "nxs": "http://purl.org/nexusformat/definitions/",
    "prov": "http://www.w3.org/ns/prov#",
    "wd": "https://www.wikidata.org/entity/"
  },
  "@id": "xas:487y54",
  "@type": [
    "schema:Thing",
    "schema:Product"
  ],
  "schema:additionalType": [
    "wd:Q3099911"
  ],
  "schema:name": "x-ray absorption analysis system",
  "schema:identifier": [
    "xas:487y54"
  ],
  "description": "use wikidata scientificInstruments (wd:Q3099911). In the future use wd:Q1584378 (measuring eq1upment because instrument likely includes various parts that are not strictly measureing instruments.   Wikidata measuringSystem (wd:Q1372376) might be an alternative.",
  "schema:hasPart": [
    {
      "@type": [
        "schema:Thing",
        "schema:Product"
      ],
      "schema:additionalType": [
        "nxs:BaseClass/NXsource",
        "wd:Q3099911"
      ],
      "schema:name": "source of x-ray excitation for analysis. Made up for this example",
      "schema:identifier": "should have a registry with URIs",
      "schema:additionalProperty": [
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Field/NXsource/type"
          ],
          "schema:name": "X-ray source",
          "schema:value": "Synchrotron X-ray Source"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Field/NXsource/probe"
          ],
          "schema:name": "Probe",
          "schema:value": "x-ray"
        }
      ]
    },
    {
      "@type": [
        "schema:Thing",
        "schema:Product"
      ],
      "schema:additionalType": [
        "xas:Beamline",
        "wd:Q3099911"
      ],
      "schema:name": "13-BM-D",
      "schema:identifier": "should have a registry with URIs",
      "schema:additionalProperty": [
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "xas:collimation"
          ],
          "schema:name": "collimation technique",
          "schema:value": "none"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "xas:focusing"
          ],
          "schema:name": "focusing",
          "schema:value": "???"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "xas:harmonic_rejection"
          ],
          "schema:name": "harmonic_rejection",
          "schema:value": "Rh-coated mirror, detuned"
        }
      ]
    },
    {
      "@type": [
        "schema:Thing",
        "schema:Product"
      ],
      "schema:additionalType": [
        "nxs:BaseClass/NXmonochromator",
        "wd:Q3099911"
      ],
      "schema:name": "Si 111",
      "schema:additionalProperty": [
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Field/NXcrystal/d_spacing"
          ],
          "schema:name": "d-spacing",
          "schema:value": "3.13550",
          "schema:unitText": "Angstrom"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Field/NXcrystal/chemical_formula"
          ],
          "schema:name": "chemical formula",
          "schema:value": "Si"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Field/NXcrystal/type"
          ],
          "schema:name": "crystal type",
          "schema:value": "channel-cut"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Field/NXcrystal/reflection"
          ],
          "schema:name": "reflection plane (hkl)",
          "schema:value": "1,1,1"
        }
      ]
    },
    {
      "@type": [
        "schema:Thing",
        "schema:Product"
      ],
      "schema:name": "Beam monitor and detectors",
      "schema:additionalType": [
        "nxs:BaseClass/NXmonitor"
      ],
      "schema:additionalProperty": [
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Field/NXmonitor/mode"
          ],
          "schema:name": "monitor mode",
          "schema:value": "monitor"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "nxs:Field/NXmonitor/preset"
          ],
          "schema:name": "monitor preset",
          "schema:value": "N.A."
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "xas:detector.i0"
          ],
          "schema:name": "detector mode i0",
          "schema:alternateName": "incident flux measurement method",
          "schema:value": "10cm  N2"
        },
        {
          "@type": [
            "schema:PropertyValue"
          ],
          "schema:propertyID": [
            "xas:detector.it"
          ],
          "schema:name": "detector mode it",
          "schema:alternateName": "transmitted flux measurement method",
          "schema:value": "10cm  N2"
        }
      ]
    }
  ]
}